The present work addressed the challenges of identifying applicable Non-Destructive Testing (NDT) techniques suitable for inspection and materials characterization techniques for Wire and Arc Additive Manufacturing (WAAM) parts. With the view of transferring WAAM to the industry and qualifying the manufacturing process for applications such as structural components, the quality of the produced parts needs to be assured. Thus, the main objective of this paper is to review the main NDT techniques and assess the capability of detecting WAAM defects, for inspection either in a monitoring, in-process or post-process scenario. Radiography and ultrasonic testing were experimentally tested on reference specimens in order to compare the techniques capabilities. Metallographic, hardness and electrical conductivity analysis were also applied to the same specimens for material characterization. Experimental outcomes prove that typical WAAM defects can be detected by the referred techniques. The electrical conductivity measurement may complement or substitute some destructive methods used in AM processing.

A novel Eddy Current (EC) probe configurations were developed to detect millimeter defects with any orientation on inner or outer pipe surfaces. The probes were designed and experimentally validated in different materials where the defects tested were identified with a high sensitivity and good signal-to-noise ratio.

Novel eddy current probes were developed to detect sub-millimetre defects with any orientation on the inner surface of pipes. Five different probes were designed, produced and experimentally validated. These probes include arrays of planar trapezoidal coils in a flexible substrate used alone or together with different winded drive coils. Numerical simulations with Finite Element Method were used to predict the probe response to defects with any orientation. Experimental results in austenitic steel jackets used in ITER revealed that the new probes have an improved reliability compared to conventional toroidal bobbin probes, allowing a higher sensitivity to circumferential defects.