Environmental, Optical, and Electrical Stability Study of Solution-Processed Zinc-Tin-Oxide Thin-Film Transistors | invisible

Environmental, Optical, and Electrical Stability Study of Solution-Processed Zinc-Tin-Oxide Thin-Film Transistors

Citation:: Nayak, PK, Pinto JV, Goncalves G, Martins R, Fortunato E. 2011. Environmental, Optical, and Electrical Stability Study of Solution-Processed Zinc-Tin-Oxide Thin-Film Transistors. J. Disp. Technol. . 7:640-643.