<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Lajn, Alexander,</style></author><author><style face="normal" font="default" size="100%">von Wenckstern, Holger,</style></author><author><style face="normal" font="default" size="100%">Grundmann, Marius,</style></author><author><style face="normal" font="default" size="100%">Wagner, Gerald,</style></author><author><style face="normal" font="default" size="100%">Barquinha</style></author><author><style face="normal" font="default" size="100%">Fortunato</style></author><author><style face="normal" font="default" size="100%">Rodrigo Martins</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Comparative study of transparent rectifying contacts on semiconducting oxide single crystals and amorphous thin films</style></title><secondary-title><style face="normal" font="default" size="100%">Journal of Applied Physics</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2013</style></year></dates><volume><style face="normal" font="default" size="100%">113</style></volume></record></records></xml>